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MountainsMap® SPM The image analysis product dedicated to Scanning Probe Microscopes Atomic Force Microscopes (AFM) - Scanning Tunneling Microscopes (STM) - Scanning Near-field Optical Microscopes (SNOM) ref: MNT6.S.SPM |
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MountainsMap® SPM selected features
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Desktop publishing environment
 Build your analysis report visually frame by frame in an intuitive desktop publishing environment, working in onscreen, portrait or landscape format.
Productivity features
Save common sequences of analysis steps and reuse them in any document. Use any document as a template for the automatic analysis of similar measurement data sets. Navigate to anywhere in a document with a single click using the page viewer.
Full metrological traceability
Fine tune any step at any time in the analysis workflow, which assures full metrological traceability.
Real time 3D imaging
Visualize, manipulate and fly over surfaces in real time, record flights as movies. Select any color palette for the vertical scale and fine tune it automatically or interactively to highlight surface features. Superimpose any image on the surface topography (for example phase)
Data correction and denoising
Level surfaces, define axis symmetries and rotation, set axis units, delete aberrant lines, correct anomalous lines, remove spikes by threshholding, resample for better resolution, fill in missing data points, retouch points, remove form, apply spatial filters to reveal surface features, apply tip deconvolution.
Dimensions
Measure distances, angles, areas and volumes of bumps/holes, and step heights on profiles and surfaces.
Roughness & waviness analysis
Carry out 3D roughness and waviness analysis based on the latest ISO 16610 advanced filtering techniques (robust Gaussian and spline filters).
3D analytical studies
Study 3D bearing ratio and depth distribution, analyze the material/void composition and thickness of vertical slices, and subtract one surface from another (for example to analyze wear).
ISO parameters Calculate 3D height and bearing ratio parameters (ISO 25178, EUR 15178), primary and roughness parameters (ISO 4287).
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MountainsMap® SPM optional modules
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Analyze force curves, edit axes, calibrate constants, filter noise. Automatically detect adhesion points, apply WLC model. Generate statistics on series of force curves.
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Detect and visualize grains, particles and islands, and sort them with respect to any parameter. Partition a surface into motifs applying segmentation by watersheds. Generate statistics on all/individual grains and motifs. Calculate features parameters (ISO 25178).
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Calculate volume, spatial and hybrid parameters (ISO 25178). Analyze surface isotropy, directionality and periodicity. Study functional volume and peak count distribution. Extract sub-surfaces, analyze them independently. Apply morphological filters.
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Extend the field of view of your instrument by automatically stitching together multiple overlapping measurements. Automatic overlap using best fit Extend the vertical range by patching together measurements made at different heights into a single surface.
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Filter noisy images by thresholding the FFT Filter ouitr specific frequencies by direct edition of the FFT Analyze frequency spectrum, power spectrum density, etc. Calculate auto- and inter-correlations.
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Visualize and analyze surface evolution with respect to a 4th dimension (time, temperature, etc.) Fly over a surface as it changes, record an animated movie generate statistics on surface change highlight areas of preponderant change.
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Measure dimensions, radii, diameters, angles. Define nominal form using auto-dimensioning and interactive tools. Specify tolerances and check for form deviations.
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Visualize deviations from nominal form. Analyze profiles with significant positional tolerances. Compare with CAD models (DXF)
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Apply metrological filters (roughness/waviness) from ISO 16610. Study the bearing ratio and depth distribution. Carry out 2D spectral analysis and fractal analysis. Create a series of profiles and analyze the profiles statistically.
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Generate statistics on multiple populations. Update statistics dynamically when new measurements are made. Generate capability parameters (Cpk) to monitor the repeatability of the production process.
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Instrument compatibility
Agilent Technologies 5x00 series
Burleigh Instruments Vista
CSM Instruments
Digital Instruments Nanoscope
Molecular Imaging PicoScan
Nanosurf Nanite, EasyScan
NT-MDT NTegra, Solver
Omicron
Pacific Nano. Nano-R AFM
Park Systems XE series
Quesant Q-Scope
SII Nano. Nanopics, SPA-Series
SIS Brucker
Veeco Dimension, Nanoscope
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