Abrasive grade 320 measured by a Nobis chromatic confocal gauge.
(2.5 mm x 2.3 mm x 133µm)

Diode measured by AFM.
(2,5 µm x 2,5 µm x 99 nm)

Gold coated holographic diffraction grating measured by AFM.
(767 nm x 767 nm x 60 nm)

Organic material measured by AFM. Phase layer (Z in degrees) overlaid on topography layer. (1.2 µm x 1.2 µm)

VLSI component measured by AFM.
(35 µm x 35 µm x 409 nm)

Scratches on a mechanical bearing.
(8 mm x 7.2 mm x 150 µm)

Copper pads on a PCB
(printed circuit board).
(3.1 mm x 2.7 mm x 190 µm)

Absorbent paper.
(1 mm x 1.2 mm x 297 µm)

Laser pits on surface.
(61 µm x 61 µ mm x 395 nm)